SPIE Proceedings [SPIE SPIE Nanoscience + Engineering - San Diego, California, United States (Sunday 28 August 2016)] Optical Sensing, Imaging, and Photon Counting: Nanostructured Devices and Applications 2016 - Center for Semiconductor Materials and Device Modeling: expanding collaborative research opportunities between government, academia, and industry
Razeghi, Manijeh, Temple, Dorota S., Brown, Gail J., Perconti, Philip, Bedair, Sarah S., Bajaj, Jagmohan, Schuster, Jonathan, Reed, MeredithVolume:
9933
Year:
2016
Language:
english
DOI:
10.1117/12.2240312
File:
PDF, 421 KB
english, 2016