Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns
Mrugalski, Grzegorz, Rajski, Janusz, Rybak, Lukasz, Solecki, Jedrzej, Tyszer, JerzyYear:
2016
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2016.2597214
File:
PDF, 7.79 MB
english, 2016