The Duty Cycle Analysis for Electromagnetic Field Exposure From WLAN in a Busy Period
Yang, Wanchun, Hu, Yanxia, Gao, Xieping, Hu, Kai, Xiao, Fen, Cao, ChunhongVolume:
58
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/TEMC.2016.2586105
Date:
December, 2016
File:
PDF, 270 KB
english, 2016