Analog/RF Study of Self-aligned In0.53Ga0.47As MOSFET with Scaled Gate Length
Dehzangi, Arash, Larki, Farhad, Mohd Razip Wee, M. F., Wichmann, Nicolas, Majlis, Burhanuddin Y., Bollaert, SylvainVolume:
46
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-016-4964-9
Date:
February, 2017
File:
PDF, 1.85 MB
english, 2017