Leakage Current Paths in Isolated AlGaN/GaN Heterostructures
Moereke, Janina, Morvan, Erwan, Vandendaele, William, Allain, Fabienne, Torres, Alphonse, Charles, Matthew, Plissonnier, MarcYear:
2016
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/tsm.2016.2598179
File:
PDF, 1.03 MB
english, 2016