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A New Method to Estimate Failure Temperatures of Semiconductor Devices under Electrostatic Discharge Stresses
Miao, Meng, Zhou, Yuanzhong, Salcedo, Javier A., Hajjar, Jean-Jacques, Liou, Juin J.Year:
2016
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2016.2608328
File:
PDF, 376 KB
english, 2016