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The Linearized Inverse Problem in Multifrequency Electrical Impedance Tomography
Alberti, Giovanni S., Ammari, Habib, Jin, Bangti, Seo, Jin-Keun, Zhang, WenlongVolume:
9
Language:
english
Journal:
SIAM Journal on Imaging Sciences
DOI:
10.1137/16M1061564
Date:
January, 2016
File:
PDF, 2.66 MB
english, 2016