[IEEE 2016 American Control Conference (ACC) - Boston, MA, USA (2016.7.6-2016.7.8)] 2016 American Control Conference (ACC) - A review of scanning methods and control implications for scanning probe microscopy
Teo, Yik R., Yong, Yuen K., Fleming, Andrew J.Year:
2016
Language:
english
DOI:
10.1109/ACC.2016.7526837
File:
PDF, 752 KB
english, 2016