[IEEE 2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) - Chicago, IL, USA (2016.4.11-2016.4.15)] 2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) - Diversity-Aware Mutation Adequacy Criterion for Improving Fault Detection Capability
Shin, Donghwan, Yoo, Shin, Bae, Doo-HwanYear:
2016
Language:
english
DOI:
10.1109/ICSTW.2016.37
File:
PDF, 348 KB
english, 2016