[IEEE 2016 IEEE Ninth International Conference on Software...

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[IEEE 2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) - Chicago, IL, USA (2016.4.11-2016.4.15)] 2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW) - Diversity-Aware Mutation Adequacy Criterion for Improving Fault Detection Capability

Shin, Donghwan, Yoo, Shin, Bae, Doo-Hwan
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Year:
2016
Language:
english
DOI:
10.1109/ICSTW.2016.37
File:
PDF, 348 KB
english, 2016
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