The Influence of Microwave Pulse Width on the Thermal Burnout Effect of an LNA Constructed by the SiGe HBT
Hou, Lun, Du, Zhengwei, Fu, JunYear:
2016
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/TEMC.2016.2603525
File:
PDF, 2.11 MB
english, 2016