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Trimodal Scan-Based Test Paradigm
Mrugalski, Grzegorz, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy, Wang, ChenYear:
2016
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2016.2608984
File:
PDF, 4.01 MB
english, 2016