SPIE Proceedings [SPIE Eighth International Symposium on Advanced Optical Manufacturing and Testing Technology (AOMATT2016) - Suzhou, China (Tuesday 26 April 2016)] 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment - Design of a photoelectron/ion imaging spectrometer with high temporal resolution
Zhang, Yudong, Wu, Fan, Xu, Ming, To, Sandy, Liu, Yuzhu, Guan, Yue, Ao, Kuang, Pei, Shixin, Gu, Fang, Su, Jing, Xu, LinhuaVolume:
9684
Year:
2016
Language:
english
DOI:
10.1117/12.2243431
File:
PDF, 479 KB
english, 2016