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Influence of SiO2surface passivation on carrier lifetimes in n-type Hg0.7Cd0.3Te
J. Schilz, R. Hellos, J. ZieglerVolume:
5
Language:
english
Pages:
3
DOI:
10.1007/bf00717881
Date:
February, 1994
File:
PDF, 216 KB
english, 1994