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[IEEE 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS)] - Toyama, Japan (2016.6.26-2016.6.30)] 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS) - Fabrication and characterization of a multiple gate nanowire FET for detecting spatially distributed molecular charges
Sasaki, Kentaro, Kuroda, Ryota, Yin, Xiang, Sato, Masaki, Ogawa, Takuji, Kasai, SeiyaYear:
2016
Language:
english
DOI:
10.1109/ICIPRM.2016.7528638
File:
PDF, 653 KB
english, 2016