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[IEEE 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2016.7.18-2016.7.21)] 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Combinational logic analysis case studies using laser voltage probing
Lua, Winson, Ranganathan, Gopinath, Ravikumar, Venkat Krishnan, Phoa, AngelineYear:
2016
DOI:
10.1109/IPFA.2016.7564246
File:
PDF, 414 KB
2016