Quantitative Two-Layer Conductivity Inversion of...

Quantitative Two-Layer Conductivity Inversion of Multi-Configuration Electromagnetic Induction Measurements

Mester, Achim, van der Kruk, Jan, Zimmermann, Egon, Vereecken, Harry
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Volume:
10
Year:
2011
Language:
english
Journal:
Vadose Zone Journal
DOI:
10.2136/vzj2011.0035
File:
PDF, 1.72 MB
english, 2011
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