[IEEE 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2016.7.18-2016.7.21)] 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - A review on degradation physics of high power LEDs in outdoor applications
MingTan, Cher, Singh, PreetpalYear:
2016
Language:
english
DOI:
10.1109/IPFA.2016.7564322
File:
PDF, 315 KB
english, 2016