A novel correlative model of failure mechanisms for...

  • Main
  • 2016 / 9
  • A novel correlative model of failure mechanisms for...
Microelectronics Reliability 2016 / 9

A novel correlative model of failure mechanisms for evaluating MEMS devices reliability

Li, Yaqiu, Sun, Yufeng, Hu, Weiwei, Wang, Zili
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.07.016
Date:
September, 2016
File:
PDF, 1.10 MB
english, 2016
Conversion to is in progress
Conversion to is failed