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[IEEE 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2016.7.18-2016.7.21)] 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Nanoprobing on the SRAM static noise margin (SNM) soft fail analysis
Chen, C. Q., Ng, P. T., Rivai, Francis, Ma, Y. Z., Tan, P. K., Tan, H., Lam, Jeffery, Mai, Z. H.Year:
2016
DOI:
10.1109/IPFA.2016.7564248
File:
PDF, 291 KB
2016