[IEEE 2016 IEEE International Conference on Semiconductor Electronics (ICSE) - Kuala Lumpur, Malaysia (2016.8.17-2016.8.19)] 2016 IEEE International Conference on Semiconductor Electronics (ICSE) - Analyze of threshold voltage in SOI PMOSFET device using Taguchi method
Aziz, M.N.I.A., Salehuddin, F., Zain, A.S.M., Kaharudin, K.E., Hazura, H., Idris, S.K., Hanim, A.R., Manap, ZahariahYear:
2016
Language:
english
DOI:
10.1109/SMELEC.2016.7573600
File:
PDF, 587 KB
english, 2016