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[IEEE 2016 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2016.6.12-2016.6.13)] 2016 IEEE Silicon Nanoelectronics Workshop (SNW) - Two competing limiters in MOSFETs scaling: Neutral defects and S/D plasmons
Hsieh, Shang-Hsun, Hung, Jo-Chun, Weng, Heng-Jui, Tsai, Ming-Fu, Chiang, Chih-Chi, Chen, Ming-JerYear:
2016
Language:
english
DOI:
10.1109/SNW.2016.7577971
File:
PDF, 1.17 MB
english, 2016