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[IEEE 2016 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2016.6.12-2016.6.13)] 2016 IEEE Silicon Nanoelectronics Workshop (SNW) - Analysis of AC- gm dispersions due to traps in nitride charge trap layer and generated interface traps in 3-D NAND flash memory cells
Kang, Ho-Jung, Jeong, Min-Kyu, Choi, Nagyong, Park, Byung-Gook, Lee, Jong-HoYear:
2016
Language:
english
DOI:
10.1109/SNW.2016.7577994
File:
PDF, 676 KB
english, 2016