[IEEE 2016 IEEE Silicon Nanoelectronics Workshop (SNW) -...

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[IEEE 2016 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2016.6.12-2016.6.13)] 2016 IEEE Silicon Nanoelectronics Workshop (SNW) - Re-examination the effects of selenium segregation on the Schottky barrier height reduction of the NiGe/Ge contact

Chen, Yi-Ju, Chou, Hung-Ju, Li, Ching-I, Tsui, Bing-Yue
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Year:
2016
Language:
english
DOI:
10.1109/SNW.2016.7578006
File:
PDF, 1.17 MB
english, 2016
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