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[IEEE 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS)] - Toyama, Japan (2016.6.26-2016.6.30)] 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS) - Measurement of channel temperature in Ga2O3 MOSFETs
Wong, Man Hoi, Morikawa, Yoji, Sasaki, Kohei, Kuramata, Akito, Yamakoshi, Shigenobu, Higashiwaki, MasatakaYear:
2016
Language:
english
DOI:
10.1109/iciprm.2016.7528764
File:
PDF, 19 KB
english, 2016