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SPIE Proceedings [SPIE SPIE Nanoscience + Engineering - San Diego, California, United States (Sunday 28 August 2016)] Nanoengineering: Fabrication, Properties, Optics, and Devices XIII - High resolution measurement of water levels in optical components
Campo, Eva M., Dobisz, Elizabeth A., Eldada, Louay A., Murrieta-Rico, Fabian N., Petranovskii, Vitalii, Sergiyenko, Oleg, Hernandez-Balbuena, Daniel, Raymond-Herrera, OscarVolume:
9927
Year:
2016
Language:
english
DOI:
10.1117/12.2238849
File:
PDF, 421 KB
english, 2016