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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 28 August 2016)] Developments in X-Ray Tomography X - A comparison of classical histology to anatomy revealed by hard x-rays
Stock, Stuart R., Müller, Bert, Wang, Ge, Richter, Claus-Peter, Tan, Xiaodong, Young, Hunter, Stock, Stuart, Robinson, Alan, Byskosh, Orest, Zheng, Jing, Soriano, Carmen, Xiao, Xianghui, Whitlon, DonnVolume:
9967
Year:
2016
Language:
english
DOI:
10.1117/12.2239146
File:
PDF, 1.22 MB
english, 2016