![](/img/cover-not-exists.png)
[ACM Press the 53rd Annual Design Automation Conference - Austin, Texas (2016.06.05-2016.06.09)] Proceedings of the 53rd Annual Design Automation Conference on - DAC '16 - Invited - A 2.2 GHz SRAM with high temperature variation immunity for deep learning application under 28nm
Liu, Chun Chen, Wang, Yen-Hsiang, Li, Yilei, Wong, Chien-Heng, Chou, Tien Pei, Chen, Young-Kai, Chang, M.-C. FrankYear:
2016
Language:
english
DOI:
10.1145/2897937.2903982
File:
PDF, 685 KB
english, 2016