Structure imaging of perfect V3Si (A15 structure) by high resolution electron microscopy
A. Ben Lamine, M. J. Lahana, F. Reynaud, P. StadelmannVolume:
3
Language:
english
Pages:
7
DOI:
10.1007/bf00724385
Date:
May, 1984
File:
PDF, 2.83 MB
english, 1984