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Tensile fracture of integrated single-crystal silicon nanowire using MEMS electrostatic testing device
Tsuchiya, Toshiyuki, Hemmi, Tetsuya, Suzuki, Jun-ya, Hirai, Yoshikazu, Tabata, OsamuVolume:
2
Year:
2016
Language:
english
Journal:
Procedia Structural Integrity
DOI:
10.1016/j.prostr.2016.06.178
File:
PDF, 1.06 MB
english, 2016