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SIMS profile analyses for Ge-, Co- and Fe-doped InP substrates used in epitaxial growth
B. Cockayne, G. T. Brown, W. R. MacEwan, G. W. BlackmoreVolume:
2
Language:
english
Pages:
5
DOI:
10.1007/bf00726316
Date:
July, 1983
File:
PDF, 283 KB
english, 1983