Modern methods and means for nondestructive testing of the quality of power semiconductor devices
Khorol’skii, V. Ya., Ershov, A. B., Efanov, A. V.Volume:
87
Language:
english
Journal:
Russian Electrical Engineering
DOI:
10.3103/S1068371216070038
Date:
July, 2016
File:
PDF, 591 KB
english, 2016