Mechanisms of deformation-induced trace element migration in zircon resolved by atom probe and correlative microscopy
Reddy, Steven M., van Riessen, Arie, Saxey, David W., Johnson, Tim E., Rickard, William D.A., Fougerouse, Denis, Fischer, Sebastian, Prosa, Ty J., Rice, Katherine P., Reinhard, David A., Chen, Yimeng,Volume:
195
Language:
english
Journal:
Geochimica et Cosmochimica Acta
DOI:
10.1016/j.gca.2016.09.019
Date:
December, 2016
File:
PDF, 3.29 MB
english, 2016