Degradation and recovery of variability due to BTI

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Microelectronics Reliability 2016 / 9

Degradation and recovery of variability due to BTI

Schlünder, Christian, Berthold, Jörg, Proebster, Fabian, Martin, Andreas, Gustin, Wolfgang, Reisinger, Hans
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.07.007
Date:
September, 2016
File:
PDF, 3.07 MB
english, 2016
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