Back-gate effects and mobility characterization in junctionless transistor
Parihar, Mukta Singh, Liu, Fanyu, Navarro, Carlos, Barraud, Sylvain, Bawedin, Maryline, Ionica, Irina, Kranti, Abhinav, Cristoloveanu, SorinVolume:
125
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2016.07.016
Date:
November, 2016
File:
PDF, 954 KB
english, 2016