Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2
Winkler, Florian, Tavabi, Amir H., Barthel, Juri, Duchamp, Martial, Yucelen, Emrah, Borghardt, Sven, Kardynal, Beata E., Dunin-Borkowski, Rafal E.Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2016.07.016
Date:
July, 2016
File:
PDF, 1.87 MB
english, 2016