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Influence of the substrate on the structure stability LaLuO3 thin films deposited by PLD method
Kopia, A., Kowalski, K., Leroux, Ch., Gavarri, J.R.Volume:
134
Language:
english
Journal:
Vacuum
DOI:
10.1016/j.vacuum.2016.10.005
Date:
December, 2016
File:
PDF, 22.81 MB
english, 2016