3D Auger quantitative depth profiling of individual...

3D Auger quantitative depth profiling of individual nanoscaled III–V heterostructures

Hourani, W., Gorbenko, V., Barnes, J.-P., Guedj, C., Cipro, R., Moeyaert, J., David, S., Bassani, F., Baron, T., Martinez, E.

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Volume:

213

Language:

english

Journal:

Journal of Electron Spectroscopy and Related Phenomena

DOI:

10.1016/j.elspec.2016.09.008

Date:

November, 2016

File:

PDF, 4.63 MB

english, 2016

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