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Ku band damage characteristics of GaAs pHEMT induced by a front-door coupling microwave pulse
Liu, Yang, Chai, ChangChun, Fan, QingYang, Shi, ChunLei, Xi, Xiaowen, Yu, XinHai, Yang, YingTangLanguage:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2016.09.002
Date:
September, 2016
File:
PDF, 2.36 MB
english, 2016