Coaxial ion micro-source for VP/ESEM – E-beam impact mode

Vacuum 2016 / 10 Vol. 132

Coaxial ion micro-source for VP/ESEM – E-beam impact mode

Slówko, W., Wiatrowski, A.
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Volume:
132
Language:
english
Journal:
Vacuum
DOI:
10.1016/j.vacuum.2016.07.027
Date:
October, 2016
File:
PDF, 2.44 MB
english, 2016
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