![](/img/cover-not-exists.png)
Characterization of the structure of low-e substrates and consequences for IR transflection measurements
DeVetter, Brent M., Kenkel, Seth, Mittal, Shachi, Bhargava, Rohit, Wrobel, Tomasz P.Language:
english
Journal:
Vibrational Spectroscopy
DOI:
10.1016/j.vibspec.2016.09.001
Date:
September, 2016
File:
PDF, 2.77 MB
english, 2016