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[Semiconductors and Semimetals] Measurement of High-Speed Signals in Solid State Devices Volume 28 || Chapter 4 Electro-Optic Measurement Techniques for Picosecond Materials, Devices, and Integrated Circuits
Valdmanis, J.A.Year:
1990
Language:
english
DOI:
10.1016/s0080-8784(08)62786-6
File:
PDF, 4.20 MB
english, 1990