[IEEE 2016 IEEE AUTOTESTCON - Anaheim, CA, USA (2016.9.12-2016.9.15)] 2016 IEEE AUTOTESTCON - A modular, extendible, and reusable test configuration for design verification testing of mission computers
Turkuzan, Mehmet, Yildirim, Yusuf, Atakan, Hayati Cem, Degerli, MertYear:
2016
Language:
english
DOI:
10.1109/AUTEST.2016.7589585
File:
PDF, 375 KB
english, 2016