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[IEEE 2016 35th Chinese Control Conference (CCC) - Chengdu, China (2016.7.27-2016.7.29)] 2016 35th Chinese Control Conference (CCC) - The study on hard landing prediction model with optimized parameter SVM method
Hu, Chen, Zhou, Sheng-Han, Xie, Yue, Chang, Wen-BingYear:
2016
Language:
english
DOI:
10.1109/ChiCC.2016.7554018
File:
PDF, 338 KB
english, 2016