[IEEE 2016 35th Chinese Control Conference (CCC) - Chengdu, China (2016.7.27-2016.7.29)] 2016 35th Chinese Control Conference (CCC) - Fault diagnosis for attitude sensors via a bank of extended Kalman filters
Li, Liliang, Wang, Zhenhua, Shen, YiYear:
2016
Language:
english
DOI:
10.1109/ChiCC.2016.7554400
File:
PDF, 305 KB
english, 2016