[IEEE 2016 35th Chinese Control Conference (CCC) - Chengdu,...

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[IEEE 2016 35th Chinese Control Conference (CCC) - Chengdu, China (2016.7.27-2016.7.29)] 2016 35th Chinese Control Conference (CCC) - Fault diagnosis for attitude sensors via a bank of extended Kalman filters

Li, Liliang, Wang, Zhenhua, Shen, Yi
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Year:
2016
Language:
english
DOI:
10.1109/ChiCC.2016.7554400
File:
PDF, 305 KB
english, 2016
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