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[IEEE 2016 IEEE 6th International Conference on Advanced Computing (IACC) - Bhimavaram, India (2016.2.27-2016.2.28)] 2016 IEEE 6th International Conference on Advanced Computing (IACC) - Entropy Based ROI Extraction and Modified Contour Model for Image Segmentation
Verma, Shiv Kumar, Kaur, Gagandeep, Kumar, AnilYear:
2016
Language:
english
DOI:
10.1109/IACC.2016.68
File:
PDF, 660 KB
english, 2016