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[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Root cause of degradation in novel HfO2-based ferroelectric memories
Pesic, Milan, Fengler, Franz P. G., Slesazeck, Stefan, Schroeder, Uwe, Mikolajick, Thomas, Larcher, Luca, Padovani, AndreaYear:
2016
Language:
english
DOI:
10.1109/IRPS.2016.7574619
File:
PDF, 1.11 MB
english, 2016