[IEEE 2016 39th International Spring Seminar on Electronics Technology (ISSE) - Pilsen, Czech Republic (2016.5.18-2016.5.22)] 2016 39th International Spring Seminar on Electronics Technology (ISSE) - Data driven prognostics for predicting remaining useful life of IGBT
Ahsan, Mominul, Stoyanov, Stoyan, Bailey, ChrisYear:
2016
Language:
english
DOI:
10.1109/ISSE.2016.7563204
File:
PDF, 825 KB
english, 2016