Study of Inherent Gate Coupling Nonuniformity of InAs/GaSb Vertical TFETs
Hsu, Ching-Yi, Zeng, Yuping, Chang, Chen-Yen, Hu, Chenming, Chang, Edward YiYear:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2016.2612830
File:
PDF, 1.95 MB
english, 2016