X-ray spectroscopic study of the nature of the...

Journal of Structural Chemistry 1984 / 03-04 Vol. 25; Iss. 2

X-ray spectroscopic study of the nature of the oxygen-silicon bond in organosilicon compounds

A. T. Shuvaev, B. Yu. Khel'mer, T. L. Krasnova, L. N. Mazalov, T. A. Lyubeznova
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Volume:
25
Language:
english
Pages:
3
DOI:
10.1007/bf00747368
Date:
March, 1984
File:
PDF, 231 KB
english, 1984
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