Te inclusion-induced electrical field perturbation in...

Micron 2016 / 09 Vol. 88

Te inclusion-induced electrical field perturbation in CdZnTe single crystals revealed by Kelvin probe force microscopy

Gu, Yaxu, Jie, Wanqi, Li, Linglong, Xu, Yadong, Yang, Yaodong, Ren, Jie, Zha, Gangqiang, Wang, Tao, Xu, Lingyan, He, Yihui, Xi, Shouzhi
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Volume:
88
Language:
english
Journal:
Micron
DOI:
10.1016/j.micron.2016.06.001
Date:
September, 2016
File:
PDF, 1.42 MB
english, 2016
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